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Dual Channel TFProbe Spectroscopic reflectometer for film thickness measurement
Dual Channel TFProbe Spectroscopic reflectometer for film thickness measurement
Dual Channel TFProbe Spectroscopic reflectometer for film thickness measurement

Dual Channel TFProbe Spectroscopic reflectometer for film thickness measurement

$ 4488

Availability: 100 in stock
  • Condition: New – Open box
  • All returns accepted: ReturnsNotAccepted

    Description

    This is new dual channel spectroscopic reflectometer for film thickness measurements. It comes with TFProbe 2.4 version Software, made by Angstrom Sun Technologies Inc. with Software license dongle USB key and CD-Rom. Sample Stage and reflection probe are not included. But you can check our other items or contact Angstrom Sun Technologies Inc to purchase. Application Support might also be available.